KOSCO AS
Semiconductor Test Equipment
Precision That Defines Perfection — Setting a New Standard in Semiconductor Testing
K-SEM™ – High-Resolution Scanning Electron Microscope
Precision at the Nanoscale.
K-SEM™ is a state-of-the-art scanning electron microscope (SEM) designed for next-generation semiconductor inspection and advanced materials analysis.With a resolution capability of below 1 nanometer, K-SEM™ delivers unparalleled clarity in imaging nano-scale patterns and critical device structures.
Key Features:
- < 1 nm resolution for ultra-fine surface structure analysis
- Auto-alignment system for rapid setup and consistent imaging accuracy
- High-magnification nano-pattern analysis, ideal for advanced semiconductor nodes
- Intuitive graphical user interface (GUI) with real-time imaging feedback
- Compatible with various conductive and non-conductive materials
Applications:
- Semiconductor device failure analysis
- Lithography pattern fidelity verification
- Advanced packaging structure inspection
- Nanomaterial research and cross-sectional imaging
K-RAY™ – 3D X-ray Inspection System
Reveal the Invisible — In Real Time
K-RAY™ is a high-performance 3D X-ray inspection system designed to detect internal defects in advanced semiconductor packages.With real-time imaging capabilities, K-RAY™ enables precise analysis of TSVs (Through-Silicon Vias) and micro-bump structures, ensuring structural integrity in high-density packaging.
Key Features
- 3D X-ray visualization of internal structures and hidden defects
- Specialized for TSV and micro-bump inspection
- Real-time image processing with automated measurement algorithms
- High-speed scanning and high-resolution output
- Supports a wide range of package types and materials
Main Applications
- Internal defect analysis in semiconductor packages
- TSV alignment and fill status inspection
- Micro-bump and solder joint failure detection
- Inspection of advanced BGA, FOWLP, and 3D IC packages
KOSCO INSIGHT AI™ – AI Defect Analysis Platform
Smarter Defect Detection. Smarter Decisions.
KOSCO INSIGHT AI™ is an advanced AI-powered analysis platform designed to transform semiconductor defect inspection with automated classification, process feedback, and root-cause prediction.By combining deep learning algorithms with real-time data visualization, it helps engineers make faster, more accurate decisions across complex production environments.
Key Features
- AI-driven defect classification with high accuracy
- Real-time process feedback loop for rapid quality control
- Root-cause analysis engine using historical defect pattern data
- Customizable dashboards with interactive defect maps and charts
- Seamless integration with inspection equipment and MES systems
Main Applications
- Inline defect data analysis and visualization
- Pattern-based failure prediction and risk assessment
- Process optimization across packaging, testing, and assembly
- Data-driven yield improvement for semiconductor fabs